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학술지 Terahertz Dielectric Response of Ferroelectric BaxSr1-xTiO3 Thin Films
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저자
강승범, 곽민환, 김성일, 정세영, 류한철, 전동석, 백문철, 차은종, 강광용
발행일
201110
출처
Ferroelectrics, v.422 no.1, pp.5-8
ISSN
0015-0193
출판사
Gordon and Breach
DOI
https://dx.doi.org/10.1080/00150193.2011.594748
협약과제
10MB1400, THz파 발진 변환 검출기 및 신호원, 강광용
초록
Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric thin BaxSr 1-xTiO3 films in the frequency range of 0.3 to 2.5 THz. The BaxSr1-xTiO3 films were deposited on (001) MgO substrate by pulsed laser deposition. The measured complex dielectric function was compared with the Cole-Cole relaxation model and agreed well with the theoretical fit. Copyright © Taylor & Francis Group, LLC.
키워드
Complex dielectric constant, Ferroelectric Ba Sr TiO thin film x 1-x 3, Terahertz time-domain spectroscopy
KSP 제안 키워드
Cole-Cole, Complex Dielectric Constant, Dielectric properties, Dielectric response, Frequency Range, MgO substrate, Pulsed-laser deposition(PLD), Relaxation model, complex dielectric function, terahertz time-domain spectroscopy, thin film(TF)