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학술지 Continuous-Wave Terahertz System Based on a Dual-Mode Laser for Real-Time Non-Contact Measurement of Thickness and Conductivity
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저자
문기원, 김남제, 신준환, 윤영종, 한상필, 박경현
발행일
201402
출처
Optics Express, v.22 no.3, pp.2259-2266
ISSN
1094-4087
출판사
Optical Society of America(OSA)
DOI
https://dx.doi.org/10.1364/OE.22.002259
협약과제
13VE1200, 테라헤르츠 영상?분광 복합 포터블 스캐너 기술 개발 , 박경현
초록
Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results. © 2014 Optical Society of America.
KSP 제안 키워드
Broadband measurement, Broadband pulse, Coated glass, Continuous-wave terahertz, Dual-mode laser, Hall measurement, ITO film, Non-contact measurement, Real-time measurement, THz system, continuous wave(CW)