Subjects : automatic test
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2006 | An Automatic Generation Method of Wireless USB Test Cases for Wireless Environment Lee Hyun Jeong International Conference on Optical Internet and Next Generation Network (COIN-NGNCON) 2006, pp.171-173 | 0 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| Final Report | 2019 | Development of Automatic Test System for Mass Production of Ultra-fast Proximity Communication (Zing) Chip | Moon-Sik Lee |