Subjects : thickness prediction
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2020 | Feasibility Study of Predicting Semiconductor Thin Film Thickness Based on 1D Convolutional Neural Network 박효빈 International Conference on Consumer Electronics (ICCE) 2020 : Asia, pp.266-269 | 3 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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