Subjects : drive-level capacitance profiling
Type | Year | Title | Cited | Download |
---|---|---|---|---|
Conference | 2015 | Light-Induced Metastable Defects in CBD-ZnS/Cu(In,Ga)Se2 Interface Measured by Drive-Level Capacitance Profiling Lee Woo Jung IUMRS International Conference on Advanced Materials (IUMRS-ICAM) 2015, pp.1-1 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
---|---|---|---|---|---|
No search results. |
Type | Year | Research Project | Primary Investigator | Download |
---|---|---|---|---|
No search results. |