Subjects : Fault tolerance analysis
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| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Registered | 2015 | 건축 문화재 모델링 장치 및 방법 | KOREA | KIPRIS | |
| Registered | 2015 | 라이트필드 촬영 장치 및 방법 | KOREA | KIPRIS |
| Type | Year | Research Project | Primary Investigator | Download |
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