Subjects : diode characteristics
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2017 | High Temperature Storage Test and Its Effect on the Thermal Stability and Electrical Characteristics of AlGaN/GaN High Electron Mobility Transistors Jongmin Lee Current Applied Physics, v.17, no.2, pp.157-161 | 15 | 원문 |
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