Subjects : Precision Measurement
| Type | Year | Title | Cited | Download |
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| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| Registered | 2020 | Method and apparatus for guiding the multi-view capture for the precision measurement or 3D reconstruction based on the machine learning | UNITED STATES |
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| Annual Report | 2025 | Terahertz Precision Measurement Technology Development Center | Lee Eui Su | |
| Annual Report | 2023 | Terahertz Precision Measurement Technology Development Center | Lee Il Min |