Subjects : measurement and modeling
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2020 | International Standardization Trend for Semiconductor EMC Technology Kim Wonjong 대한전자공학회 학술 대회 (추계) 2020, pp.994-997 |
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| Type | Year | Research Project | Primary Investigator | Download |
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