Subjects : IC Reliability
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2009 | Effect of Silicidation on Silicon-Based Thin Film Resistors in SiGe Integrated Circuits Lee Sang-Heung Journal of Materials Science : Materials in Electronics, v.20, no.4, pp.354-359 | 0 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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