Subjects : failure analysis
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2019 | Lifetime Prediction and Failure Analysis based on Accelerated Life Test of AWG Module for Optical Communication Yun Kwang Su International Conference on Materials and Reliability (ICMR) 2019, pp.7-8 | ||
| Journal | 2017 | High Temperature Storage Test and Its Effect on the Thermal Stability and Electrical Characteristics of AlGaN/GaN High Electron Mobility Transistors Jongmin Lee Current Applied Physics, v.17, no.2, pp.157-161 | 16 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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