Subjects : Fabric defects
Type | Year | Title | Cited | Download |
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Journal | 2021 | Rotation Estimation and Segmentation for Patterned Image Vision Inspection Cheonin Oh Electronics, v.10, no.23, pp.1-20 | 4 | 원문 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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Type | Year | Research Project | Primary Investigator | Download |
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