Subjects : Void defects
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Terahertz imaging of 100 µm scale subsurface defects in both depth and lateral directions in silicone rubber Da Hye Choi Applied Optics, v.64, no.25, pp.7520-7526 | 0 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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