Subjects : Programming characteristics
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2010 | Characterization of Nonvolatile Memory Behaviors of Al/Poly(vinylidene fluoride-trifluoroethylene)/Al2O3/ZnO Thin-Film Transistors Yoon Sung Min Japanese Journal of Applied Physics, v.49, no.4 PART 2, pp.1-6 | 20 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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