Subjects : Relative sensitivity factors
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Accurate Quantification of Cu(In,Ga)Se2 Films by AES Depth Profiling Analysis 장종식 Applied Surface Science, v.282, pp.777-781 | 8 | 원문 |
| Journal | 2012 | Quantitative Analysis of Cu(In,Ga)Se2 Thin Films by Secondary Ion Mass Spectrometry Using a Total Number Counting Method 장종식 Metrologia, v.49, no.4, pp.522-529 | 12 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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