Subjects : Loss of effectiveness
Type | Year | Title | Cited | Download |
---|---|---|---|---|
Journal | 2016 | Mutation Testing Cost Reduction by Clustering Overlapped Mutants Ma Yu Seung Journal of Systems and Software, v.115, pp.18-30 | 44 | 원문 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
---|---|---|---|---|---|
No search results. |
Type | Year | Research Project | Primary Investigator | Download |
---|---|---|---|---|
No search results. |