Patent

Registered High-resolution optical microscope system using polarizer and fast Fourier transform method for a nanowire device

편광판과 고속푸리에변환을 이용한 나노선 소자용 고분해능 광학 현미경 시스템
Inventors
Kim Eunkyoung, Kang-Ho Park, Park Jonghyurk, Moon Seungeon, Lee Hongyeol, Kim Jongdae, 김규태, 박응석, 장도영, 지현진
Application No.
07285276 (1995.11.01)
Publication No.
09121679 (1997.05.13)
Registration No.
4690379 (2011.02.25)
Country
JAPAN
Project Code
06MB3100, Components/Module technology for Ubiquitous Terminals, Kim Jongdae
Abstract
(57)[要約][課題] 従来の菜果切断用指ハサミは切断刃の部分の摩耗が発生し、切れ味が低下するという不具合を解消すべく替刃方式の菜果切断用指ハサミを提供する。[解決手段] 人差指1に挿入し、野
KSP Keywords
Fast Fourier, Fast Fourier transform method, Fourier transform(FT), Fourier transform method(FTM), Optical Microscope, Transform method, fast Fourier transform(FFT), high-resolution(HR), nanowire device
Family
 
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Status Patent Country KIPRIS
Registered 편광판과 고속 푸리에 변환을 이용한 나노선 감지용 광학 현미경 시스템 KOREA KIPRIS