Patent

Registered METHOD AND APPARATUS FOR DETECTING ABNORMALITY OF MANUFACTURING FACILITY

Inventors
Kang Hyun Chul, Eun Seo Lee, Ji Yeon Son, Park Ho Jin
Application No.
17136654 (2020.12.29)
Publication No.
20210240167 (2021.08.05)
Registration No.
11709474 (2023.07.25)
Country
UNITED STATES
Project Code
18PH3400, Manufacturing and Assembly as a Service (MAaS), Ji Yeon Son
Abstract
A method and apparatus for detecting an abnormality of a manufacturing facility is disclosed. According to an example embodiment of the present disclosure, a learning model generating method for manufacturing facility abnormality detection may include receiving a measured value for a normal state of a manufacturing facility collected through a multi-sensor on a time-by-time basis, generating a learning model including a predetermined weight set and training the learning model using the measured value, and determining, using the learning model, a threshold corresponding to a boundary between the normal state and an abnormal state of the manufacturing facility and a criterion for determining the abnormal state in a local window representing a predetermined time interval.
KSP Keywords
Abnormal state, Abnormality detection, Generating method, Multi-Sensor, Normal state, Time interval, learning models, local window
Family
 
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Status Patent Country KIPRIS
Registered 제조 설비의 이상 감지 방법 및 장치 KOREA