Patent

Registered 양자 진단 회로 및 그것의 양자 특성 진단 방법

Inventors
전성익, 고광원, 김강호, 김창대, 김태훈
Application No.
2020-0179529 (2020.12.21)
Publication No.
10-2022-0089757 (2022.06.29)
Registration No.
2799607 (2025.04.18)
Country
KOREA
Project Code
20ZS1300, Research on High Performance Computing Technology to overcome limitations of AI processing, Kim Kang Ho
Family
 
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Status Patent Country KIPRIS
Registered QUANTUM DIAGNOSTIC CIRCUIT AND QUANTUM CHARACTERISTIC DIAGNOSTIC METHOD UNITED STATES