ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

특허 검색
구분 출원국
출원년도 ~ 키워드

상세정보

등록 파장 자동 인식 장치 및 방법

파장 자동 인식 장치 및 방법
이미지 확대
발명자
문실구, 이은구, 이상수, 설동민, 정의석, 조정식, 이종현
출원번호
13538482 (2012.06.29)
공개번호
20130004165 (2013.01.03)
등록번호
9106335 (2015.08.11)
출원국
미국
협약과제
초록
Provided are an automatic wavelength recognition apparatus and method. The automatic wavelength recognition apparatus includes: a division unit receiving a single optical signal and dividing the received optical signal into a plurality of optical signals; a plurality of filter units filtering the optical signals and having different and wavelength-dependent pass characteristics; a plurality of detection units detecting the filtered optical signals and measuring intensities of the detected optical signals; at least one comparison unit comparing outputs of any two of the detection units; and a wavelength determination unit receiving an output of the at least one comparison unit and determining a wavelength of the above single optical signal using a pre-stored look-up table.
KSP 제안 키워드
Optical signal, Wavelength-dependent, look-up table