ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

특허 검색
구분 출원국
출원년도 ~ 키워드

상세정보

등록 지연측정장치 및 그 방법

지연측정장치 및 그 방법
이미지 확대
발명자
신종윤, 김종호, 윤지욱, 김광준, 이종현
출원번호
13684459 (2012.11.23)
공개번호
20130129347 (2013.05.23)
등록번호
9112603 (2015.08.18)
출원국
미국
협약과제
초록
An apparatus and method for measuring a delay. The apparatus for measuring a delay includes an overhead inserting unit configured to inserting a time stamp into an overhead of a multiframe to be transmitted from a first location to a second location; an overhead extracting unit configured to extract a time stamp from an overhead of a multiframe received from the second location, the time stamp including bypass delay information of the second location; and a delay measuring unit configured to measure a round trip delay between the first location and the second location using the inserted time stamp and the extracted time stamp and adjust the measured round trip delay using the extracted bypass delay information.
KSP 제안 키워드
Measuring unit, Time Stamp, round trip delay