ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

특허 검색
구분 출원국
출원년도 ~ 키워드

상세정보

등록 고에너지 입자 분석 장치 및 이를 이용한 분석 방법

발명자
정문연, 명남수, 이황운, 송동훈, 김승환, 신동호
출원번호
13873708 (2013.04.30)
공개번호
20130299706 (2013.11.14)
등록번호
9182502 (2015.11.10)
출원국
미국
협약과제
초록
Provided is an analysis apparatus for a high energy particle and an analysis method for a high energy particle. The analysis apparatus for the high energy particle includes a scintillator generating photons with each unique wavelength by the impinging with a plurality of kinds of accelerated high energy particles, a parallel beam converting unit making the photons proceed in parallel to one another, a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength, and a plurality of sensing units arranged on positions where the photons refracted at different angles from the diffraction grating panel reach in a state of being spatially separated, and detecting each of the photons.
KSP 제안 키워드
Analysis method, Converting unit, Different angles, Diffraction grating, Parallel-Beam, high energy
패밀리
 
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구분 특허 출원국 KIPRIS
등록 고에너지 입자 분석 장치 및 이를 이용한 분석 방법 대한민국 KIPRIS