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특허 검색
구분 출원국
출원년도 ~ 키워드


등록 열전도도 측정 장치 및 그 측정 방법

현영훈, 박영삼, 장문규, 정태형
13780166 (2013.02.28)
20140010258 (2014.01.09)
9170223 (2015.10.27)
11ZE1100, ETRI 연구역량 강화를 위한 R&D체계 구축 및 Seed형 기술개발을 위한 창의형 연구 사업, 지경용
The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
KSP 제안 키워드
First stage, Heat source, Heat transmission, Measuring unit, Temperature change, connection unit, inventive concept, measuring device, thermal conductivity
패밀리 특허 목록
구분 특허 출원국 KIPRIS
등록 열전도도 측정 장치 및 그 측정 방법 대한민국 KIPRIS
등록 열전도도와 열컨덕턴스 측정장치 미국
등록 열전도도와 열컨덕턴스 측정장치 미국