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학술지 Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters
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저자
강준태, 김재우, 정진우, 최성열, 최정용, 안승준, 송윤호
발행일
201312
출처
ETRI Journal, v.35 no.6, pp.1164-1167
ISSN
1225-6463
출판사
한국전자통신연구원 (ETRI)
DOI
https://dx.doi.org/10.4218/etrij.13.0213.0346
협약과제
12ZF1100, Seed형 기술개발을 위한 창의형 연구사업, 박선희
초록
We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes. © 2013 ETRI.
키워드
Carbon nanotube, Charging, Field emission, Miniature X-ray tube, Triode
KSP 제안 키워드
Carbon nano-tube(CNT), Carbon nanotube emitters, Miniature X-ray tube, bias voltage, field emission, field emitter, gate electrode, gate leakage current, gate voltage, induced voltage