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학술지 Life Test of an X-band MMIC Multi-Function Chip for Active Phased Array Radar Applications
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저자
정진철, 곽창수, 염인복, 서인종, 조인호
발행일
201504
출처
Microelectronics Reliability, v.55 no.5, pp.815-821
ISSN
0026-2714
출판사
Elsevier
DOI
https://dx.doi.org/10.1016/j.microrel.2015.02.002
협약과제
14MR3100, 차기위성 Flexible 통신방송 탑재체 핵심기술 개발, 안재영
초록
A 1000-h steady state life test at a temperature of 125 °C was performed on ten X-band MMIC multifunction chips for use in active phase array radar systems. Internal switches, phase shifters, and attenuators were operated through an integrated serial-to-parallel converter under the five-second stepped external control signal for the life test period. None of the ten samples failed under the failure criteria based on the JEP118 standard. The calculated failure rate using the Chi Square Statistic was 1.6 e-6 failures/h for the 90% confidence level. Maximum DC current variation was +16% for an initial value. Maximum variations of small signal gain, phase shift, and attenuation were 0.96 dB, 2째, and 0.17 dB, respectively, over a frequency range of 8.5-10.5 GHz.
키워드
Digital attenuator, Digital phase shifter, Failure rate, Multifunction chip (MFC), Serial-to-parallel converter (SPC), Steady state life test
KSP 제안 키워드
5 GHz, Active phased array radar, Chi-square, Confidence Level, Control Signal, Current variation, DC current, Digital phase shifter, External control, Failure Rate, Failure criteria