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학술지 Dielectric Chricteristics of Pb(Zr,Ti)O3 Films on MgO Single Crystal Substrate by Terahertz Time Domain Spectroscopy
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저자
곽민환, 강승범, 김기출, 정세영, 김성일, 유병화, 정동철, 류한철, 전동석, 백문철, 강광용
발행일
201110
출처
Ferroelectrics, v.422 no.1, pp.19-22
ISSN
0015-0193
출판사
Gordon and Breach
DOI
https://dx.doi.org/10.1080/00150193.2011.594769
협약과제
10MB1400, THz파 발진 변환 검출기 및 신호원, 강광용
초록
Lead zirconium titanate (PbZr0.52Ti0.48O3 and PbZr0.30Ti0.70O3) films were prepared on MgO (100) substrate by the sol-gel method. Film Thickness, microstructure and crystalline structure of the films were investigated by scanning electron microscope (SEM) and X-ray diffraction analysis, respectively. Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric Pb(Zr, Ti)O3 thin films in the frequency range of 0.2 to 2.0 THz. Copyright © Taylor & Francis Group, LLC.
키워드
Complex dielectric constant, Ferroelectric Pb(Zr, Terahertz time-domain spectroscopy, Ti)O thin film 3
KSP 제안 키워드
Complex Dielectric Constant, Crystalline structure, Dielectric properties, Frequency Range, Lead zirconium titanate, MgO single crystal substrate, X-ray diffraction analysis, film thickness, scanning electron microscope, sol-gel method, terahertz time-domain spectroscopy