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Conference Paper
Study on Gate Around Transistor(GAT) Layout for Radiation Hardness
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- Authors
- Min-Su Lee, Yong Soo Lee, Chul Bum Kim, Young Ho Kim, Byoung Gon Yu, Hee Chul Lee
- Issue Date
- 2008-07
- Citation
- Asia-pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD) 2008, pp.1-6
- Language
- English
- Type
- Conference Paper
- KSP Keywords
- radiation hardness