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Conference Paper Study on Gate Around Transistor(GAT) Layout for Radiation Hardness
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Authors
Min-Su Lee, Yong Soo Lee, Chul Bum Kim, Young Ho Kim, Byoung Gon Yu, Hee Chul Lee
Issue Date
2008-07
Citation
Asia-pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD) 2008, pp.1-6
Language
English
Type
Conference Paper
KSP Keywords
radiation hardness