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학술지 Infrared Spectroscopy and Nano-Imaging of the Insulator-to-Metal Transition in Vanadium Dioxide
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저자
M.M. Qazilbash, M. Brehm, G.O. Andreev, A. Frenzel, P.C. Ho, 채병규, 김봉준, 윤선진, 김현탁, A.V. Balatsky, O.G. Shpyrko, M.B. Maple, F. Keilmann, D.N. Basov
발행일
200902
출처
Physical Review B : Condensed Matter and Materials Physics, v.79 no.7, pp.1-10
ISSN
1098-0121
출판사
American Physical Society(APS)
DOI
https://dx.doi.org/10.1103/PhysRevB.79.075107
협약과제
09MB2300, 전기적 점프(Current Jump)를 이용한 신소자 기술, 김현탁
초록
We present a detailed infrared study of the insulator-to-metal transition (IMT) in vanadium dioxide (VO2) thin films. Conventional infrared spectroscopy was employed to investigate the IMT in the far field. Scanning near-field infrared microscopy directly revealed the percolative IMT with increasing temperature. We confirmed that the phase transition is also percolative with cooling across the IMT. We present extensive near-field infrared images of phase coexistence in the IMT regime in VO2. We find that the coexisting insulating and metallic regions at a fixed temperature are static on the time scale of our measurements. A distinctive approach for analyzing the far-field and near-field infrared data within the Bruggeman effective medium theory was employed to extract the optical constants of the incipient metallic puddles at the onset of the IMT. We found divergent effective carrier mass in the metallic puddles that demonstrates the importance of electronic correlations to the IMT in VO2. We employ the extended dipole model for a quantitative analysis of the observed near-field infrared amplitude contrast and compare the results with those obtained with the basic dipole model. © 2009 The American Physical Society.
KSP 제안 키워드
Amplitude contrast, Extended dipole model, Far-field and near-field, Increasing temperature, Infrared data, Infrared image, Infrared microscopy, Infrared spectroscopy(FT-IR in real time), Infrared study, Nano-imaging, Phase coexistence