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학술지 Micro X-Ray Diffraction Study in VO2 Films - Separation between Metal-Insulator Transition and Structural Phase Transition
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저자
김봉준, 이용욱, 최성열, 임정욱, 윤선진, 김현탁
발행일
200806
출처
Physical Review B : Condensed Matter and Materials Physics, v.77 no.23, pp.1-18
ISSN
1098-0121
출판사
American Physical Society(APS)
DOI
https://dx.doi.org/10.1103/PhysRevB.77.235401
협약과제
08MB3100, 전기적 점프(Current Jump)를 이용한 신소자 기술, 김현탁
초록
In order to clarify whether VO2 is a Mott insulator or a Peierls insulator, the metal-insulator transition (MIT) and the structural phase transition (SPT) are simultaneously monitored for VO2 films by current-voltage curve and diffraction measurements using a synchrotron micro-x-ray beam. In the regime showing a metallic conductivity below the SPT temperature (approximately 70°C), only the diffraction planes of the monoclinic structure are observed, while planes of the tetragonal structure are absent. This observation reveals the presence of a monoclinic and metal phase between the MIT and the SPT as a characteristic of a Mott insulator. © 2008 The American Physical Society.
KSP 제안 키워드
Metal phase, Mott insulator, Tetragonal structure, X-ray diffraction study, current-voltage curve, metal-insulator transition, metallic conductivity, monoclinic structure, structural phase transition