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학술지 Magnetic Instability of Giant Magnetoresistance Spin-Valves due to Electromigrationinduced Inter-Diffusion
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저자
징지앙, 배성태, 류호준
발행일
200907
출처
Thin Solid Films, v.517 no.18, pp.5557-5562
ISSN
0040-6090
출판사
Elsevier
DOI
https://dx.doi.org/10.1016/j.tsf.2009.04.028
초록
Electromigration-induced magnetic failures in NiFe/(Co)/Cu/(Co)/NiFe spin-valve (SV) multilayers have been investigated. Electrically stressed NiFe/Cu/NiFe SV multilayers showed a dramatic reduction of magnetic moment up to 41%, and a shift of interlayer coupling characteristics, while no obvious magnetic degradation was observed in the NiFe/Co/Cu/Co/NiFe SV multilayers. It was experimentally confirmed that the magnetic degradation of the NiFe/Cu/NiFe SV multilayers is primarily due to the formation of Ni-Cu intermixing caused by the electromigration-induced Cu spacer inter-diffusion. Furthermore, it was demonstrated that an ultra thin Co diffusion barrier at the NiFe/Cu interface is promisingly effective to improve the magnetic stability of NiFe/(Co)/Cu/(Co)/NiFe SV multilayers against electromigration. © 2009 Elsevier B.V. All rights reserved.
키워드
Cu spacer inter-diffusion, Electromigration-induced failures, GMR spin-valve multi-layers, Magnetic instability
KSP 제안 키워드
Co diffusion, Coupling Characteristics, Cu spacer inter-diffusion, Diffusion barrier(DB), Electromigration-induced failures, GMR spin-valve multi-layers, Giant magnetoresistance(GMR), Magnetic moment, Ni-Cu, Spin valves, Ultra-thin