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학술지 80 μW/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems
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저자
한진호, 권영수, 신경선, 유회준
발행일
201710
출처
Journal of Semiconductor Technology and Science, v.17 no.5, pp.627-635
ISSN
1598-1657
출판사
대한전자공학회 (IEIE)
DOI
https://dx.doi.org/10.5573/JSTS.2017.17.4.627
협약과제
17HB2500, 초절전 하이퍼바이저 기반 지능정보 매니코어프로세서 및 SW기술 개발, 권영수
초록
The processor is becoming increasingly susceptible to transient faults with fluctuating voltage, widening operating temperature, and increasing clock frequency. Especially, processor, operating near threshold voltage for a low power, can expose to transient faults with the thin margin of process, voltage, and temperature. This paper presents a fault tolerant processor having on-chip fault monitor systems for processor core and cache, which detects faults and corrects faults, and a fault injector which injects faults for testing. The fault tolerant feature is analyzed by a fault injection and quantitative analysis complying with ISO26262 standard. As a result, the proposed work achieves 80 쨉W/MHz energy efficiency, 850 MHz maximum frequency, 72% fault trap reduction, and 99.23% single point fault failure rate complying with ISO26262.
키워드
Fault injection, Fault monitor, Fault tolerant processor, ISO26262, Near threshold voltage
KSP 제안 키워드
Clock frequency, Energy Efficiency, Failure Rate, Fault Injection, Fault-tolerant, Low-Power, Maximum Frequency, Near Threshold Voltage, On-chip, Processor core, Single point