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Journal Article
High Roughness Ag Back Reflector on a Metal Underlayer for Thin Film Solar Cell Applications
- Authors
- Yoo Jeong Lee, Chang Bong Yeon, Sun Jin Yun, Kyu-Sung Lee, Jung Wook Lim, Kyoung-Bo Kim, Jehoon Baek
- Issue Date
- 2013-12
- Citation
- Materials Research Bulletin, v.48 no.12, pp.5093-5098
- ISSN
- 0025-5408
- Publisher
- Elsevier
- Language
- English
- Type
- Journal Article
- Project Code
- 12MB4900, Development of a-Si/SiGe tandem structure thin film solar cells of conversion efficiency 13% on flexible metal substrate, Sun Jin Yun
- Abstract
- The roughness development of Ag film was investigated for potential as a back reflector material in thin film solar cells on flexible stainless steel (STS) substrates. The influence of metal underlayers was evaluated in order to obtain a rough Ag film at a low deposition temperature (?돞400 °C). By depositing Ag on a 100 nm Al underlayer to induce Ag-Al alloying, the film roughness was increased three times more than that of Ag films on bare STS at 400 °C. The Ag film deposited on an Al underlayer at 350 °C exhibited 75 nm roughness and uniformly distributed crystallites, which was effective for visible light scattering. The Ag-Al alloy phase was also controlled using the thickness ratio of Ag and Al. The present work clearly demonstrated that an Ag back reflector film with a higher roughness could be fabricated through inserting a metal underlayer at a deposition temperature much lower than the 500 °C that has been reported in earlier works. © 2013 Elsevier Ltd. All rights reserved.
- KSP Keywords
- 5 nm, Ag film, Ag-Al, Al alloying, Back reflector, Film roughness, Roughness development, Stainless steel(SUS316), Thickness ratio, Thin film solar cells, Uniformly distributed