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Journal Article Depinning of the Fermi Level at the Ge Schottky Interface through Se Treatment
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Authors
V. Janardhanam, Hyung-Joong Yun, Jouhan Lee, V. Rajagopal Reddy, Hyobong Hong, Kwang-Soon Ahn, Chel-Jong Choi
Issue Date
2013-12
Citation
Scripta Materialia, v.69, no.11-12, pp.809-811
ISSN
1359-6462
Publisher
Elsevier
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.1016/j.scriptamat.2013.09.004
Abstract
Depinning of the Fermi level at Al/Ge junctions was achieved through Se treatment. Al contacts to n- and p-type Ge with Se treatment exhibited ohmic and Schottky behaviors, respectively. During Se treatment, in addition to surface passivation by Se atoms, the chemical reaction between Se and Ge resulted in the formation of a partially ionic Se-Ge alloy film. This led to the reduction of surface states, which was responsible for the Fermi-level depinning of Ge. © 2013 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
KSP Keywords
Alloy films, Fermi-level depinning, Schottky interface, Surface passivation, chemical reaction(Biomimetic), p-Type, surface states