ETRI-Knowledge Sharing Plaform

KOREAN
논문 검색
Type SCI
Year ~ Keyword

Detail

Journal Article Fabrication of Superjunction Trench Gate Power MOSFETs Using BSG-Doped Deep Trench of p-Pillar
Cited 8 time in scopus Download 34 time Share share facebook twitter linkedin kakaostory
Authors
Sang Gi Kim, Hoon Soo Park, Kyoung Il Na, Seong Wook Yoo, Jongil Won, Jin Gun Koo, Sang Hoon Chai, Hyung-Moo Park, Yil Suk Yang, Jin Ho Lee
Issue Date
2013-08
Citation
ETRI Journal, v.35, no.4, pp.632-637
ISSN
1225-6463
Publisher
한국전자통신연구원 (ETRI)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.4218/etrij.13.1912.0012
Abstract
In this paper, we propose a superjunction trench gate MOSFET (SJ TGMOSFET) fabricated through a simple p-pillar forming process using deep trench and boron silicate glass doping process technology to reduce the process complexity. Throughout the various boron doping experiments, as well as the process simulations, we optimize the process conditions related with the p-pillar depth, lateral boron doping concentration, and diffusion temperature. Compared with a conventional TGMOSFET, the potential of the SJ TGMOSFET is more uniformly distributed and widely spread in the bulk region of the n-drift layer due to the trenched p-pillar. The measured breakdown voltage of the SJ TGMOSFET is at least 28% more than that of a conventional device. © 2013 ETRI.
KSP Keywords
Boron doping, Breakdown Voltage, Deep Trench, Doping concentration, Doping process, Forming processes, Glass doping, Process complexity, Process conditions, Silicate glasses, Uniformly distributed