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학술지 The Observation of Electrical Hysteric Behavior in Synthesized V2O5 Nanoplates by Recrystallization
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저자
김창희, 윤용주, Byung Hoon Kim, Won G. Hong, 김약연, 장원익, Nae-Eung Lee, 유한영
발행일
201312
출처
Journal of Nanomaterials, v.2013, pp.1-8
ISSN
1687-4110
출판사
Hindawi Publishing
DOI
https://dx.doi.org/10.1155/2013/807895
초록
The anomalous electrical conductance for the V2O5 foam synthesized via a foaming process was measured. In the annealing process, the synthesized V2O5 foam is recrystallized with the increase of annealing temperature. The recrystallization procedure was characterized by using physical analysis tools such as thermogravimetric analysis (TGA), differential scanning calorimetry (DSC), scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), and X-ray diffractometer. In the electrical analysis technique of current-voltage characteristics as a function of annealing temperature, an anomalous hysteric behavior appears at the annealing temperature of 400°C. We conclude that the recrystallization of V2O5 nanoplates results in the anomalous behavior in voltage-dependent current characteristics. © 2013 Chang-Hee Kim et al.
KSP 제안 키워드
Annealing temperature, Anomalous behavior, Current characteristics, Differential scanning calorimetry(photo-DSC), Differential scanning calorimetry (dsc), Electrical analysis, Electrical conductance, Foaming process, Recrystallization procedure, Scanning electron microscopy(S.E.M.), Thermogravimetric analysis (tga)