상세정보
학술지
Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters
- 발행일
- 201312
- 출처
- ETRI Journal, v.35 no.6, pp.1164-1167
- ISSN
- 1225-6463
- 출판사
- 한국전자통신연구원 (ETRI)
- 협약과제
- 12ZF1100, Seed형 기술개발을 위한 창의형 연구사업, 박선희
- 초록
- We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes. © 2013 ETRI.
- KSP 제안 키워드
- Carbon nano-tube(CNT), Carbon nanotube emitters, Miniature X-ray tube, bias voltage, field emission, field emitter, gate electrode, gate leakage current, gate voltage, induced voltage