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Journal Article
Analysis of Failure in Miniature X‐ray Tubes with Gated Carbon Nanotube Field Emitters
- Authors
- Jun-Tae Kang, Jae-Woo Kim, Jin-Woo Jeong, Sungyoul Choi, Jeongyong Choi, Seungjoon Ahn, Yoon-Ho Song
- Issue Date
- 2013-12
- Citation
- ETRI Journal, v.35, no.6, pp.1164-1167
- ISSN
- 1225-6463
- Publisher
- 한국전자통신연구원 (ETRI)
- Language
- English
- Type
- Journal Article
- Abstract
- We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes. © 2013 ETRI.
- KSP Keywords
- Bias voltage, Carbon nano-tube(CNT), Carbon nanotube emitters, Field Emission, Gate voltage, Induced Voltage, Miniature X-ray tube, field emitter, gate electrode, gate leakage current