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Conference Paper
Standardization of Calibrating Probe for Chip-Level EMC
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- Authors
- Soon-Il Yeo, Seong-Soo Lee, Jae-Kyung Wee, Pil-Soo Lee
- Issue Date
- 2013-01
- Citation
- International Conference on Circuits, Systems, Signal and Telecommunications (CSST) 2013 / International Conference on VLSI Design and Implementation (VLSI) 2013, pp.87-90
- Publisher
- WSEAS
- Language
- English
- Type
- Conference Paper
- Abstract
- New calibration method for the near field scanning probe (NFP) is suggested. For the design of system-on-chip (SoC), NFA or NFP can be used to probe the electromagnetic characteristics of a chip. And if the probe is not calibrated properly, it is difficult to find out proper conditions of the electromagnetic characteristics. In this paper, some standardized guidelines for the calibration of the probe. Also, circular style test fixture of the probe is suggested in this paper.
- KSP Keywords
- Calibration method, Electromagnetic characteristics, Scanning probe, System-On-Chip(SoC), Test fixture, near-field scanning