BROWSE
Detail
Conference Paper
Field Emission X-ray Source with Submicron Focal Spot for the Computerized Tomography System
Cited - time in 
Share 
Share
- Authors
- Jin-Woo Jeong, Sora Park, Sungyoul Choi, Jun-Tae Kang, Yoon-Ho Song, Jae-Woo Kim, Min-Sik Shin, Seungjoon Ahn
- Issue Date
- 2014-06
- Citation
- International Vacuum Electron Sources Conference (IVESC) 2014, pp.1-2
- Language
- English
- Type
- Conference Paper
- Abstract
- The x-ray tube with carbon nanotube (CNT) emitter is currently developing for nondestructive chip inspection. In order to realize a submicron-focus x-ray tube, we have developed CNT tip emitter with high current density under the specially designed focusing system. The developed paste-based emitter shows several tens A/cm 2 of current density [1].
- KSP Keywords
- Carbon nano-tube(CNT), Computerized Tomography, Field Emission, Focal spot, Focusing system, High Current Density, X-ray sources, tip emitter, x-ray tube