상세정보
학술지
Quantitative Quality Assessment of Stitched Panoramic Images
- 발행일
- 201212
- 출처
- IET Image Processing, v.6 no.9, pp.1348-1358
- ISSN
- 1751-9659
- 출판사
- IET
- 협약과제
- 12ZI1100, 유비쿼터스 인프라 연구, 김봉태
- 초록
- In this study, the authors present quantitative quality assessment indices for measuring geometric and photometric qualities of stitched panoramic images, since both geometric and photometric qualities are important for obtaining a seamless panoramic image. For geometric quality assessment, our approach is based on the use of structural similarity (SSIM) index between the high-frequency information (HFI) of both geometrically corrected unstitched images and the stitched panoramic image. This measure is called 'HFI_SSIM'. The complementary low-frequency information from the same pair of images is used for assessing the photometric quality of the stitched image using the spectral angle mapper and intensity magnitude ratio measures. The proposed quality metrics are tested on both synthetic and true datasets comprising of indoor and outdoor scenes. The results obtained, highlight the interest of using the proposed quantitative measures for assessing the quality of stitched panoramic images. © The Institution of Engineering and Technology 2012.
- KSP 제안 키워드
- Assessment indices, Frequency information, High Frequency(HF), Panoramic image, Quality Metrics, Quality assessment(IQA), Quantitative measure, Spectral angle mapper, Structural similarity (SSIM) index, Structure Similarity Index measure(SSIM), low-frequency