BROWSE
Detail
Conference Paper
Non-Contact Thickness and Conductivity Measurement Using a Continuous-Wave Terahertz Spectrometer based on a 1.3 μm Dual-Mode Laser
Cited - time in 
Share 
Share
- Authors
- Kiwon Moon, Namje Kim, Jeong-Woo Park, Sang-Pil Han, Hyunsung Ko, Eui Su Lee, Il-Min Lee, Kyung Hyun Park
- Issue Date
- 2014-02
- Citation
- Photonics West 2014, pp.1-1
- Publisher
- SPIE
- Language
- English
- Type
- Conference Paper
- KSP Keywords
- Conductivity measurement, Contact thickness, Continuous-wave terahertz, Dual-mode laser, Non-contact, continuous wave(CW)