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학술대회
Non-Contact Thickness and Conductivity Measurement Using a Continuous-Wave Terahertz Spectrometer based on a 1.3 μm Dual-Mode Laser
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- 발행일
- 201402
- 출처
- Photonics West 2014, pp.1-1
- 협약과제
- 14PE1100, 테라헤르츠 영상?분광 복합 포터블 스캐너 기술 개발 , 박경현
- KSP 제안 키워드
- Conductivity measurement, Contact thickness, Continuous-wave terahertz, Dual-mode laser, Non-contact, continuous wave(CW)