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Conference Paper
The Effects of Post-Deposition Treatments of Gate Insulator on the Electrical Properties of IZO-Based Oxide TFTs
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- Authors
- Chang-Woo Song, Ji-Woong Yang, Jae-Heon Shin, Kyung-Hyun Kim, Nae-Man Park, Chan-Hwa Hong, Woo-Hyung Seo, Hyuck-In Kwon, Woo-Seok Cheong
- Issue Date
- 2014-11
- Citation
- International Conference on Electronic Materials and Nanotechnology for Green Environment (ENGE) 2014, pp.1-1
- Language
- English
- Type
- Conference Paper
- KSP Keywords
- Gate insulator, Oxide TFTs, Post-deposition treatment, electrical properties(I-V curve)