상세정보
학술지
Etching Characteristics and Mechanisms of TiO2 Thin Films in HBr/Cl 2/Ar Inductively Coupled Plasma
- 저자
- 김대희, Alexander Efremov, 장한별, 강성칠, 윤선진, 권광호
- 발행일
- 201212
- 출처
- Japanese Journal of Applied Physics, v.51 no.10, pp.1-5
- ISSN
- 0021-4922
- 출판사
- Japan Society of Applied Physics (JSAP),
- 초록
- The TiO 2 etching characteristics and mechanism in HBr/Cl2/Ar inductively coupled plasma (with a fixed bias power of 200 W) were investigated. It was found that the TiO 2 etching rate in Cl2/Ar plasma is about 8 times faster than that in HBr/Ar plasma. In both HBr-rich (60% HBr + 20% Cl2 + 20% Ar) and Cl2-rich (20% HBr + 60% Cl2 + 20% Ar) plasmas, an increase in gas pressure (4-10 mTorr) results in a non-monotonic increase in TiO 2 etching rate, while the variation of input power (500-800 W) causes a monotonic acceleration of the etching process. Plasma diagnostics by Langmuir probes and zero-dimensional plasma modeling provided data on plasma parameters, steady-state densities, and fluxes of active species on the etched surface. The model-based analysis of the TiO 2 etching kinetics shows a transitional regime of ion-assisted chemical reaction with domination of a chemical etching pathway. © 2012 The Japan Society of Applied Physics.
- KSP 제안 키워드
- Applied physics, Cl 2, Etched surface, Etching characteristics, Etching process, Gas Pressure, HBr/Ar plasma, Inductively-coupled plasma(ICP), Input power, Langmuir probe, Model-based analysis