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학술지 A semianalytical parameter extraction of a SPICE BSIM3v3 for RF MOSFET's using S-parameters
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저자
Seonghearn Lee, 유현규
발행일
200003
출처
IEEE Transactions on Microwave Theory and Techniques, v.48 no.3, pp.412-416
ISSN
0018-9480
출판사
IEEE
DOI
https://dx.doi.org/10.1109/22.826840
협약과제
00MM1200, 2GHz대역 RF CMOS 집적회로 기술개발, 유현규
초록
In this paper, we present a new parameter-extraction method combining analytical and optimization approaches for the RF large-signal Berkeley Short-Channel IGFET Model 3, Version 3.0. Using S-parameters of MOSFET's with different channel lengths and widths at zero gate bias, all overlap capacitances are accurately determined in the high-frequency range. The junction-capacitance model parameters are extracted using S1-parameter s of devices with different perimeter-to-area ratios at two different biases of zero and high voltages. A robust technique utilizing simple Z-parameter equations is also used to extract resistances (Rg and Rd) and inductances. The source and substrate resistances are initially determined using the zero-bias optimization, and their uncertainties are subsequently eliminated in the normal-bias optimization. Good agreements between measured and modeled S-parameters from 0.5 to 12 GHz demonstrate the validity of this semianalytical method. © 2000 IEEE.
KSP 제안 키워드
Bias optimization, Capacitance model, Extraction method, Frequency Range, High Frequency(HF), Model parameter, Short channel, Z-parameter, gate bias, large signal, parameter extraction