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Journal Article
Life Test of an X-band MMIC Multi-Function Chip for Active Phased Array Radar Applications
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- Authors
- Jin-Cheol Jeong, Changsoo Kwak, In-Bok Yom, In-Jong Seo, In-Ho Jo
- Issue Date
- 2015-04
- Citation
- Microelectronics Reliability, v.55, no.5, pp.815-821
- ISSN
- 0026-2714
- Publisher
- Elsevier
- Language
- English
- Type
- Journal Article
- Abstract
- A 1000-h steady state life test at a temperature of 125 °C was performed on ten X-band MMIC multifunction chips for use in active phase array radar systems. Internal switches, phase shifters, and attenuators were operated through an integrated serial-to-parallel converter under the five-second stepped external control signal for the life test period. None of the ten samples failed under the failure criteria based on the JEP118 standard. The calculated failure rate using the Chi Square Statistic was 1.6 e-6 failures/h for the 90% confidence level. Maximum DC current variation was +16% for an initial value. Maximum variations of small signal gain, phase shift, and attenuation were 0.96 dB, 2째, and 0.17 dB, respectively, over a frequency range of 8.5-10.5 GHz.
- KSP Keywords
- 5 GHz, Active phased array radar, Chi-square, Confidence Level, Control Signal, Current variation, DC current, External control, Frequency range, Initial value, Life Test