상세정보
학술지
Echelle Grating Silicon Multi/Demultiplexers with Single-reflection Total Internal Reflectors
- 발행일
- 201210
- 출처
- Optics Express, v.20 no.21, pp.23582-23586
- ISSN
- 1094-4087
- 출판사
- Optical Society of America(OSA),
- 협약과제
- 12VB1600, 실리콘 나노포토닉스 기반 차세대 컴퓨터 칩기술, 김경옥
- 초록
- We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520-1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings. © 2012 Optical Society of America.
- KSP 제안 키워드
- Adjacent channel, Channel crosstalk, Channel spacing, Characteristic features, Echelle grating, Internal reflector, Retro-reflector, Silicon On Insulator(SOI), insertion loss