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Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design
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- Issue Date
- 2001-05
- Citation
- International Microwave Symposium (IMS) 2001, pp.1727-1730
- Language
- English
- Type
- Conference Paper
- Abstract
- The frequency-variant characteristics of a silicon substrate were physically modeled, analytically investigated, and experimentally verified. The scalable circuit model parameter extraction methodology was newly developed. Thus, the proposed technique can provides the efficient performance evaluations as well as the accurate design guidelines concerned with the complicated mixed signal integrated circuit designs.
- KSP Keywords
- Experimental verification, Integrated Circuit Design, Model parameter extraction, Noise modeling, Performance evaluation, Silicon substrate, Substrate coupling noise, circuit model, design guidelines, integrated circuit(IC), mixed signal