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Conference Paper ASM 시스템의 slotted modulation mask 측정환경 구성
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Authors
이성준, 권헌국, 박봉혁
Issue Date
2014-06
Citation
대한전자공학회 종합 학술 대회 (하계) 2014, pp.368-371
Publisher
대한전자공학회
Language
Korean
Type
Conference Paper
Abstract
This paper presents environment configuration for the measure of the slotted modulation mask characteristics of a newly developed application specific message (ASM) system. The environment utilizes a test vector generated through a sample rate scaling of a long term evolution (LTE) signal with the Agilent MXG signal generator in which a careful operation is emphasized. The environment will be employed in the development process of a power amplifier (PA) of the ASM system.
KSP Keywords
Long Term Evolution(LTE), Sample rate, Signal Generator, application specific, development process, power amplifiers(PAs), test vector