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Conference Paper
ASM 시스템의 slotted modulation mask 측정환경 구성
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- Issue Date
- 2014-06
- Citation
- 대한전자공학회 종합 학술 대회 (하계) 2014, pp.368-371
- Publisher
- 대한전자공학회
- Language
- Korean
- Type
- Conference Paper
- Abstract
- This paper presents environment configuration for the measure of the slotted modulation mask characteristics of a newly developed application specific message (ASM) system. The environment utilizes a test vector generated through a sample rate scaling of a long term evolution (LTE) signal with the Agilent MXG signal generator in which a careful operation is emphasized. The environment will be employed in the development process of a power amplifier (PA) of the ASM system.
- KSP Keywords
- Long Term Evolution(LTE), Sample rate, Signal Generator, application specific, development process, power amplifiers(PAs), test vector