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Journal Article On the New Design of a 4-port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume
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Authors
Sangbong Jeon, Jaehoon Yun, Seungkeun Park
Issue Date
2012-08
Citation
ETRI Journal, v.34, no.4, pp.621-624
ISSN
1225-6463
Publisher
한국전자통신연구원 (ETRI)
Language
English
Type
Journal Article
DOI
https://dx.doi.org/10.4218/etrij.12.0212.0022
Abstract
A new miniaturized 4-port waveguide generating a transverse electromagnetic wave is proposed. The waveguide presents enhanced performance of higher field uniformity in extended test volume up to an increased test frequency limit compared to that of the conventional 2-port waveguide. The advantageous features of the proposed waveguide have been obtained through a new design scheme based on effective miniaturization maintaining good impedance matching. Consequently, we can provide a more accurate electromagnetic compatibility test method, covering larger devices operating in higher frequencies, which is a marked improvement upon the conventional approaches. © 2012 ETRI.
KSP Keywords
Compatibility test, Design Scheme, TEM waveguide, Test frequency, cutoff frequency, electromagnetic compatibility, electromagnetic wave, enhanced performance, field uniformity, higher frequency, impedance matching