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Terahertz Dielectric Response of Ferroelectric BaxSr1-xTiO3 Thin Films
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- Authors
- Seung Beom Kang, Min Hwan Kwak, Sungil Kim, Se Young Jeong, Han Cheol Ryu, Dong Suk Jun, Mun Cheol Paek, Eun Jong Cha, Kwang Yong Kang
- Issue Date
- 2011-10
- Citation
- Ferroelectrics, v.422, no.1, pp.5-8
- ISSN
- 0015-0193
- Publisher
- Gordon and Breach
- Language
- English
- Type
- Journal Article
- Abstract
- Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric thin BaxSr 1-xTiO3 films in the frequency range of 0.3 to 2.5 THz. The BaxSr1-xTiO3 films were deposited on (001) MgO substrate by pulsed laser deposition. The measured complex dielectric function was compared with the Cole-Cole relaxation model and agreed well with the theoretical fit. Copyright © Taylor & Francis Group, LLC.
- KSP Keywords
- Cole-Cole, Dielectric properties, Dielectric response, Frequency range, MgO substrate, Pulsed-laser deposition(PLD), complex dielectric function, relaxation model, terahertz time-domain spectroscopy, thin film(TF)