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Journal Article
Dielectric Chricteristics of Pb(Zr,Ti)O3 Films on MgO Single Crystal Substrate by Terahertz Time Domain Spectroscopy
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- Authors
- Min Hwan Kwak, Seung Beom Kang, Ki-Chul Kim, Se Young Jeong, Sungil Kim, Byung Hwa Yoo, Dong Chul Chung, Han Cheol Ryu, Dong Suk Jun, Mun Cheol Paek, Kwang Yong Kang
- Issue Date
- 2011-10
- Citation
- Ferroelectrics, v.422, no.1, pp.19-22
- ISSN
- 0015-0193
- Publisher
- Gordon and Breach
- Language
- English
- Type
- Journal Article
- Abstract
- Lead zirconium titanate (PbZr0.52Ti0.48O3 and PbZr0.30Ti0.70O3) films were prepared on MgO (100) substrate by the sol-gel method. Film Thickness, microstructure and crystalline structure of the films were investigated by scanning electron microscope (SEM) and X-ray diffraction analysis, respectively. Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric Pb(Zr, Ti)O3 thin films in the frequency range of 0.2 to 2.0 THz. Copyright © Taylor & Francis Group, LLC.
- KSP Keywords
- Crystalline structure, Dielectric properties, Diffraction analysis, Film thickness, Frequency range, MgO single crystal substrate, X-ray Diffraction, X-ray diffractometer(XRD), lead zirconium titanate, scanning electron microscope, sol-gel method