상세정보
학술지
Dielectric Chricteristics of Pb(Zr,Ti)O3 Films on MgO Single Crystal Substrate by Terahertz Time Domain Spectroscopy
- 발행일
- 201110
- 출처
- Ferroelectrics, v.422 no.1, pp.19-22
- ISSN
- 0015-0193
- 출판사
- Gordon and Breach
- 협약과제
- 10MB1400, THz파 발진 변환 검출기 및 신호원, 강광용
- 초록
- Lead zirconium titanate (PbZr0.52Ti0.48O3 and PbZr0.30Ti0.70O3) films were prepared on MgO (100) substrate by the sol-gel method. Film Thickness, microstructure and crystalline structure of the films were investigated by scanning electron microscope (SEM) and X-ray diffraction analysis, respectively. Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric Pb(Zr, Ti)O3 thin films in the frequency range of 0.2 to 2.0 THz. Copyright © Taylor & Francis Group, LLC.
- KSP 제안 키워드
- Crystalline structure, Dielectric properties, Frequency Range, Lead zirconium titanate, MgO single crystal substrate, X-ray diffraction analysis, film thickness, scanning electron microscope, sol-gel method, terahertz time-domain spectroscopy, thin film(TF)